Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Optical microscope
Model:
Olympus BX51 (Olympus)
Status:
Operational
Location:
2145
Description:
Upright microscope with transmitted and reflected illuminations; Eyepiece: 10X; Objective: -10x/N.A. 0.3, W.D. 11mm, -20x/N.A. 0.45, W.D. 3.1mm, -50x/N.A. 0.8, W.D. 1.0mm, -100x/N.A. 0.9, W.D. 1.0mm; Nikon digital SLR camera D5000 for photo capture
© The Hong Kong University of Science and Technology. All rights reserved. Privacy Policy